The aim of this project is to define a mixed signal subsystem for the nanosoc reference design. 

The mixed signal subsystem should be able to sample analog signals at a regular sampling rate, and transmit a digital representation of this signal to the rest of the nanosoc system. In order to interface with real-world signals in a digital System on Chip ("SoC"), an analog to digital conversion ("ADC") is needed. 

A physical test environment is required for ASIC devices fabricated following tape out. The nanoSoC test board provides a complete test environment for ASIC designs based on the nanoSoC reference design and enables the showcase of any custom designs that utilise it.  Reviewing the function of nanoSoC identifies a number of design criteria for the test board:

The Arm PL022 provides an interface for synchronous serial communication with peripheral devices connected to the  SoC via the Advanced Peripheral Bus (APB). It supports a choice of interface operation, Motorola compatible Serial Peripheral Interface (SPI), National Semiconductor Microwire, or Texas Instruments synchronous serial interface. See the Techology page for details.